Characterization Services

Analytical Capabilities for Materials and Devices

We offer a complete range of analyses for verifying the structural, mechanical, electrical, and thermal properties of materials and prototypes, both for internal research and for external.

Structure and Microstructure

Analysis of crystal structure, present phases, morphology, and elemental composition of powders, thin films, and bulk samples.

  • X-Ray Diffraction (XRD): Phase identification, stress, texture.

Electrical and Thermophysical

Evaluation of transport properties and energy management in thermoelectric, conductive materials, and cells.

  • I-V Characterization (Current-Voltage Curve) and Resistivity.
  • Seebeck Effect Measurement (Seebeck coefficient) and electrical conductivity (LSR).
  • Hall Effect Measurement: carrier concentration and mobility (HCS1).
  • Thermal Diffusivity and Conductivity (LFA, LSR).
  • Electrochemical Tests: Impedance spectroscopy, charge/discharge cycles (SP-150).

Mechanical and Surface

In-depth testing of mechanical performance and resistance to wear and fatigue for bulk materials and coatings.

  • MicroHardness (Microdurometer): Surface mechanical properties (HX1000).
  • Thickness and Roughness Measurement (Dektak 3).
  • Residual Stress Measurement: Measurement via extensometry(MTS3000).
  • Cyclic Mechanical Fatigue Tests (Ambrosi Machine).
  • Tribology (Pin-on-Disk): Measurement of wear and friction coefficient.
  • Thermographic Analysis (Optris Pi640).

Energy and Conversion

Characterization of solar cells, thermoelectric devices (TEG), and hydrogen production systems.

  • Solar Simulator: I-V testing under standard conditions (Verasol 2).
  • TEG Characterization (Thermoelectric Devices).
  • Electrolyzer Test: Monitoring and automation of the electrolysis process.
  • Gas Composition Analysis (Quadrupole).

Specialized and Environmental

Preparation and handling services in controlled environments and measurements requiring specific conditions (e.g., high vacuum).

  • Handling in controlled atmosphere (Dry/Glove Box).
  • Vacuum Sealing for sample preparation and preservation.
  • Specific thermal treatments in controlled atmosphere (Tubular Furnace).

Computing and Modeling

Support for experimental data analysis through high-performance computing resources and secure results archiving.

  • Modeling and Simulation (PC Cluster/Workstation).
  • XRD Data Analysis and measurement curves.
  • GPU Computing for intensive calculations.
  • Data Archiving and Backup (NAS).

A Partner for Your Research

Do you need a specific characterization not listed? Contact us to discuss your needs and find the most suitable analytical solution together.


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CONTACT US

DICAM

University of Trento

via Mesiano 77

38123 Trento, Italy

Any questions on this website? Just email to: mirco.dincau@unitn.it

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